A devices for measuring low temperature of filament in ion source of VG354 thermal ionization mass spectrometer and its application

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	A devices for measuring low temperature of filament in ion source of VG354 thermal ionization mass spectrometer and its application
	Xiao, YK; Wei, H; ZWang, QZ; Zhang, CG; Sun, AD
	2002
Source Publication	CHINESE JOURNAL OF ANALYTICAL CHEMISTRY
ISSN	0253-3820
Volume	30 Issue:10 Pages:1272-1276
Abstract	A device was designed to measure low temperature of filament in ion source of VG 354 thermal ionization mass spectrometry by assembling thermocouple thermometer and connector. This device can he used to measure instantly temperature on the surface of single filament in ion source. The functional correlation between the measured temperature of filament and the heating current through the filament was characterized by aft equation of y = -ax(3) + bx(2) - cx + d. The error of measured temperature is less than +/- 2 degreesC. The device was also applied to study the characteristics of non-reductive thermal ion emission of graphite in thermal ionization mass spectrometry and to study mechanism of M2BO2+ and M2X+ emission in the presence of graphite. A device was designed to measure low temperature of filament in ion source of VG 354 thermal ionization mass spectrometry by assembling thermocouple thermometer and connector. This device can he used to measure instantly temperature on the surface of single filament in ion source. The functional correlation between the measured temperature of filament and the heating current through the filament was characterized by aft equation of y = -ax(3) + bx(2) - cx + d. The error of measured temperature is less than +/- 2 degreesC. The device was also applied to study the characteristics of non-reductive thermal ion emission of graphite in thermal ionization mass spectrometry and to study mechanism of M2BO2+ and M2X+ emission in the presence of graphite.
Indexed By	SCI
Document Type	期刊论文
Identifier	http://ir.isl.ac.cn/handle/363002/2339
Collection	青海盐湖研究所知识仓储
Recommended Citation GB/T 7714	Xiao, YK,Wei, H,ZWang, QZ,et al. A devices for measuring low temperature of filament in ion source of VG354 thermal ionization mass spectrometer and its application[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2002,30(10):1272-1276.
APA	Xiao, YK,Wei, H,ZWang, QZ,Zhang, CG,&Sun, AD.(2002).A devices for measuring low temperature of filament in ion source of VG354 thermal ionization mass spectrometer and its application.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,30(10),1272-1276.
MLA	Xiao, YK,et al."A devices for measuring low temperature of filament in ion source of VG354 thermal ionization mass spectrometer and its application".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 30.10(2002):1272-1276.

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