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Nanoscale mapping of dielectric properties based on surface adhesion force measurements 期刊论文
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2018, 卷号: 9, 页码: 900-906
作者:  Wang, Ying;  Shen, Yue;  Wang, Xingya;  Shen, Zhiwei;  Li, Bin;  Hui, Jun;  Zhang, Yi
Adobe PDF(5037Kb)  |  收藏  |  浏览/下载：75/0  |  提交时间：2018/06/20
Adhesion  Atomic Force Microscopy (Afm)  Graphene Oxide (Go)  Nanoscale Dielectric Properties  Reduced Graphene Oxide (Rgo)  
Direct imaging charge distribution in reduced graphene oxide sheets induced by isolated charges 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 卷号: 49, 期号: 41
作者:  Shen, Yue;  Wang, Ying;  Zhou, Yuan;  Shi, Anting;  Hu, Jun;  Zhang, Yi
收藏  |  浏览/下载：116/0  |  提交时间：2018/06/20
Reduced Graphene Oxide (Rgo)  Charge Distribution  Isolated Charge  Charge Injection  Scanning Polarization Force Microscopy (Spfm)