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Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets 期刊论文
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2018, 卷号: 9, 页码: 1146-1155
Authors:  Shen, Yue;  Wang, Ying;  Zhou, Yuan;  Hai, Chunxi;  Hu, Jun;  Zhang, Yi
Adobe PDF(6250Kb)  |  Favorite  |  View/Download：166/0  |  Submit date：2018/06/20
Degree Of Reduction  Dielectric Property  Electrostatic Force Microscopy  Electrostatic Force Spectroscopy  Graphene Oxide  
Nanoscale mapping of dielectric properties based on surface adhesion force measurements 期刊论文
BEILSTEIN JOURNAL OF NANOTECHNOLOGY, 2018, 卷号: 9, 页码: 900-906
Authors:  Wang, Ying;  Shen, Yue;  Wang, Xingya;  Shen, Zhiwei;  Li, Bin;  Hui, Jun;  Zhang, Yi
Adobe PDF(5037Kb)  |  Favorite  |  View/Download：81/0  |  Submit date：2018/06/20
Adhesion  Atomic Force Microscopy (Afm)  Graphene Oxide (Go)  Nanoscale Dielectric Properties  Reduced Graphene Oxide (Rgo)