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高精度热电离质谱法测定铟同位素
肖应凯; 王蕴慧; 祁海平; 金琳
1992-04-30
Source Publication分析化学
Issue4Pages:458-460
Abstract本文系统研究了高精度热电离质谱测定铟同位素的方法,采用磷酸涂样技术,获得了强而稳定的In~+离子流,5种锢试剂中的平均~(113)In/~(115)In比值为0.044804±0.000055(2SD),由此比值计算的铟原子量为114.8185(2)比现行的114.82更为精密。
Keyword量同位素 热电离 铟原子量
Language中文
Document Type期刊论文
Identifierhttp://ir.isl.ac.cn/handle/363002/1374
Collection青海盐湖研究所知识仓储
Recommended Citation
GB/T 7714
肖应凯,王蕴慧,祁海平,等. 高精度热电离质谱法测定铟同位素[J]. 分析化学,1992(4):458-460.
APA 肖应凯,王蕴慧,祁海平,&金琳.(1992).高精度热电离质谱法测定铟同位素.分析化学(4),458-460.
MLA 肖应凯,et al."高精度热电离质谱法测定铟同位素".分析化学 .4(1992):458-460.
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