Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets

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	Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets
	Shen, Yue1,2 ; Wang, Ying 2,3; Zhang, Jinjin 2; Hai, Chunxi 1; Zhou, Yuan1 ; Hu, Jun2 ; Zhang, Yi 2
	2014-06-28
发表期刊	JOURNAL OF APPLIED PHYSICS
卷号	115 期号:24
摘要	A unique operation mode of scanning polarization force microscopy (SPFM) was developed for characterizing reduced graphene oxide (rGO) sheets that were individually charged, mainly by monitoring the change of the sample's apparent height along with its surface potential. The principles and features of this sample-charged mode SPFM (SC-SPFM) were introduced. By comparing with other scanning-probe based techniques that characterize the surface electrical properties, including the traditional tip-biased mode SPFM, electrostatic force microscopy, and Kelvin probe force microscopy, it was found that the SC-SPFM has higher sensitivity and lateral resolution. Furthermore, by monitoring charge transfer between two rGO sheets with SC-SPFM, the "good"or "bad"contacts related to junction geometry at the nanometer scale can be visualized clearly. (C) 2014 AIP Publishing LLC.
语种	英语
引用统计
文献类型	期刊论文
条目标识符	http://ir.isl.ac.cn/handle/363002/5664
专题	青海盐湖研究所知识仓储中国科学院青海盐湖研究所盐湖资源与化学实验室
作者单位	1.Chinese Acad Sci, Qinghai Inst Salt Lakes, Xining 810008, Peoples R China 2.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式 GB/T 7714	Shen, Yue,Wang, Ying,Zhang, Jinjin,et al. Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets[J]. JOURNAL OF APPLIED PHYSICS,2014,115(24).
APA	Shen, Yue.,Wang, Ying.,Zhang, Jinjin.,Hai, Chunxi.,Zhou, Yuan.,...&Zhang, Yi.(2014).Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets.JOURNAL OF APPLIED PHYSICS,115(24).
MLA	Shen, Yue,et al."Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets".JOURNAL OF APPLIED PHYSICS 115.24(2014).