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Humidity effects on scanning polarization force microscopy imaging
Shen, Yue1,2; Zhou, Yuan1; Sun, Yanxia1,3; Zhang, Lijuan1,3; Wang, Ying2; Hu, Jun2; Zhang, Yi2
2017-08-01
Source PublicationAPPLIED SURFACE SCIENCE
Volume412Pages:497-504
SubtypeArticle
AbstractScanning polarization force microscopy (SPFM) is a useful surface characterization technique to visually characterize and distinguish nanomaterial with different local dielectric properties at nanometer scale. In this paper, taking the individual one-atom-thick graphene oxide (GO) and reduced graphene oxide (rGO) sheets on mica as examples, we described the influences of environmental humidity on SPFM imaging. We found that the apparent heights (AHs) or contrast of SPFM imaging was influenced significantly by relative humidity (RH) at a response time of a few seconds. And this influence rooted in the sensitive dielectric constant of mica surface to the RH change. While dielectric properties of GO and rGO sheets were almost immune to the humidity change. In addition, we gave the method to determine the critical humidity at which the contrast conversion happened under different conditions. And this is important to the contrast control and repeatable imaging of SPFM through RH adjusting. These findings suggest a strategy of controllable and repeatable imaging the local dielectric properties of nanomaterials with SPFM, which is critically important for further distinguishment, manipulation, electronic applications, etc. (C) 2017 Elsevier B.V. All rights reserved.
KeywordScanning Polarization Force Microscopy Humidity Graphene Oxide Reduced Graphene Oxide Mica
WOS HeadingsScience & Technology ; Physical Sciences ; Technology
WOS KeywordREDUCED GRAPHENE OXIDE ; WETTING PROPERTIES ; CARBON NANOTUBES ; GRAPHITE OXIDE ; MICA ; WATER ; REDUCTION ; CONDENSATION ; GLYCEROL ; SHEETS
Indexed BySCI
Language英语
WOS Research AreaChemistry ; Materials Science ; Physics
WOS SubjectChemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter
WOS IDWOS:000401392900056
Citation statistics
Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.isl.ac.cn/handle/363002/6217
Collection青海盐湖研究所知识仓储
盐湖资源与化学实验室
Affiliation1.Chinese Acad Sci, Qinghai Inst Salt Lakes, Key Lab Comprehens & Highly Efficient Utilizat Sa, Key Lab Salt Lake Resources Chem Qinghai Prov, Xining 810008, Qinghai, Peoples R China
2.Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
Recommended Citation
GB/T 7714
Shen, Yue,Zhou, Yuan,Sun, Yanxia,et al. Humidity effects on scanning polarization force microscopy imaging[J]. APPLIED SURFACE SCIENCE,2017,412:497-504.
APA Shen, Yue.,Zhou, Yuan.,Sun, Yanxia.,Zhang, Lijuan.,Wang, Ying.,...&Zhang, Yi.(2017).Humidity effects on scanning polarization force microscopy imaging.APPLIED SURFACE SCIENCE,412,497-504.
MLA Shen, Yue,et al."Humidity effects on scanning polarization force microscopy imaging".APPLIED SURFACE SCIENCE 412(2017):497-504.
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