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Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets
Shen, Yue1,2,3; Wang, Ying3; Zhou, Yuan1,2; Hai, Chunxi1,2; Hu, Jun3; Zhang, Yi3
2018-04-11
Source PublicationBEILSTEIN JOURNAL OF NANOTECHNOLOGY
Volume9Pages:1146-1155
SubtypeArticle
AbstractElectrostatic force spectroscopy (EFS) is a method for monitoring the electrostatic force microscopy (EFM) phase with high resolution as a function of the electrical direct current bias applied either to the probe or sample. Based on the dielectric constant difference of graphene oxide (GO) sheets (reduced using various methods), EFS can be used to characterize the degree of reduction of uniformly reduced one-atom-thick GO sheets at the nanoscale. In this paper, using thermally or chemically reduced individual GO sheets on mica substrates as examples, we characterize their degree of reduction at the nanoscale using EFS. For the reduced graphene oxide (rGO) sheets with a given degree of reduction (sample n), the EFS curve is very close to a parabola within a restricted area. We found that the change in parabola opening direction (or sign the parabola opening value) indicates the onset of reduction on GO sheets. Moreover, the parabola opening value, the peak bias value (tip bias leads to the peak or valley EFM phases) and the EFM phase contrast at a certain tip bias less than the peak value can all indicate the degree of reduction of rGO samples, which is positively correlated with the dielectric constant. In addition, we gave the ranking of degree for reduction on thermally or chemically reduced GO sheets and evaluated the effects of the reducing conditions. The identification of the degree of reduction of GO sheets using EFS is important for reduction strategy optimization and mass application of GO, which is highly desired owing to its mechanical, thermal, optical and electronic applications. Furthermore, as a general and quantitative technique for evaluating the small differences in the dielectric properties of nanomaterials, the EFS technique will extend and facilitate its nanoscale electronic devices applications in the future.
KeywordDegree Of Reduction Dielectric Property Electrostatic Force Microscopy Electrostatic Force Spectroscopy Graphene Oxide
WOS HeadingsScience & Technology ; Technology ; Physical Sciences
WOS KeywordGRAPHITE OXIDE ; MICROSCOPY ; POLARIZATION ; FILMS ; WATER
Indexed BySCI
Language英语
WOS Research AreaScience & Technology - Other Topics ; Materials Science ; Physics
WOS SubjectNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS IDWOS:000430355900001
Citation statistics
Document Type期刊论文
Identifierhttp://ir.isl.ac.cn/handle/363002/6383
Collection青海盐湖研究所知识仓储
盐湖资源与化学实验室
Affiliation1.Chinese Acad Sci, Qinghai Inst Salt Lakes, Key Lab Comprehens & Highly Efficient Utilizat Sa, Xining 810008, Qinghai, Peoples R China
2.Key Lab Salt Lake Resources Chem Qinghai Prov, Xining 810008, Qinghai, Peoples R China
3.Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China
Recommended Citation
GB/T 7714
Shen, Yue,Wang, Ying,Zhou, Yuan,et al. Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:1146-1155.
APA Shen, Yue,Wang, Ying,Zhou, Yuan,Hai, Chunxi,Hu, Jun,&Zhang, Yi.(2018).Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,1146-1155.
MLA Shen, Yue,et al."Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):1146-1155.
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