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Nanoscale mapping of dielectric properties based on surface adhesion force measurements
Wang, Ying1,2; Shen, Yue3; Wang, Xingya1,2,4; Shen, Zhiwei1,2,4; Li, Bin1,2; Hui, Jun1,2; Zhang, Yi1,2
2018-03-16
发表期刊BEILSTEIN JOURNAL OF NANOTECHNOLOGY
卷号9页码:900-906
文章类型Article
摘要The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.
关键词Adhesion Atomic Force Microscopy (Afm) Graphene Oxide (Go) Nanoscale Dielectric Properties Reduced Graphene Oxide (Rgo)
WOS标题词Science & Technology ; Technology ; Physical Sciences
关键词[WOS]SCANNING PROBE MICROSCOPY ; GRAPHENE OXIDE SHEETS ; LARGE ENERGY DENSITY ; POLYMER NANOCOMPOSITES ; GRAPHITE OXIDE ; COMPOSITES ; CONSTANT ; MEMBRANES ; FILMS
收录类别SCI
语种英语
WOS研究方向Science & Technology - Other Topics ; Materials Science ; Physics
WOS类目Nanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号WOS:000428094400001
引用统计
文献类型期刊论文
条目标识符http://ir.isl.ac.cn/handle/363002/6439
专题青海盐湖研究所知识仓储
作者单位1.Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China
2.Chinese Acad Sci, Shanghai Inst Appl Phys, Lab Phys Biol, Shanghai 201800, Peoples R China
3.Chinese Acad Sci, Qinghai Inst Salt Lakes, Key Lab Salt Lake Resources Chem Qinghai Prov, Xining 810008, Qinghai, Peoples R China
4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
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Wang, Ying,Shen, Yue,Wang, Xingya,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906.
APA Wang, Ying.,Shen, Yue.,Wang, Xingya.,Shen, Zhiwei.,Li, Bin.,...&Zhang, Yi.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906.
MLA Wang, Ying,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906.
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