ISL OpenIR  > 青海盐湖研究所知识仓储
Nanoscale mapping of dielectric properties based on surface adhesion force measurements
Wang, Ying1,2; Shen, Yue3; Wang, Xingya1,2,4; Shen, Zhiwei1,2,4; Li, Bin1,2; Hui, Jun1,2; Zhang, Yi1,2
2018-03-16
Source PublicationBEILSTEIN JOURNAL OF NANOTECHNOLOGY
Volume9Pages:900-906
SubtypeArticle
AbstractThe detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.
KeywordAdhesion Atomic Force Microscopy (Afm) Graphene Oxide (Go) Nanoscale Dielectric Properties Reduced Graphene Oxide (Rgo)
WOS HeadingsScience & Technology ; Technology ; Physical Sciences
WOS KeywordSCANNING PROBE MICROSCOPY ; GRAPHENE OXIDE SHEETS ; LARGE ENERGY DENSITY ; POLYMER NANOCOMPOSITES ; GRAPHITE OXIDE ; COMPOSITES ; CONSTANT ; MEMBRANES ; FILMS
Indexed BySCI
Language英语
WOS Research AreaScience & Technology - Other Topics ; Materials Science ; Physics
WOS SubjectNanoscience & Nanotechnology ; Materials Science, Multidisciplinary ; Physics, Applied
WOS IDWOS:000428094400001
Citation statistics
Document Type期刊论文
Identifierhttp://ir.isl.ac.cn/handle/363002/6439
Collection青海盐湖研究所知识仓储
Affiliation1.Chinese Acad Sci, Shanghai Inst Appl Phys, Key Lab Interfacial Phys & Technol, Shanghai 201800, Peoples R China
2.Chinese Acad Sci, Shanghai Inst Appl Phys, Lab Phys Biol, Shanghai 201800, Peoples R China
3.Chinese Acad Sci, Qinghai Inst Salt Lakes, Key Lab Salt Lake Resources Chem Qinghai Prov, Xining 810008, Qinghai, Peoples R China
4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
Recommended Citation
GB/T 7714
Wang, Ying,Shen, Yue,Wang, Xingya,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906.
APA Wang, Ying.,Shen, Yue.,Wang, Xingya.,Shen, Zhiwei.,Li, Bin.,...&Zhang, Yi.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906.
MLA Wang, Ying,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906.
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